Andrii Goriachko




Andrii Goriachko

POSITION
Assistant professor

WORK EXPERIENCE

EDUCATION AND TRAINING
19911997
M.Sc. student
Taras Shevchenko National University of Kyiv, Kyiv (Ukraine)

19972001
PhD student
Taras Shevchenko National University of Kiev, Kyiv (Ukraine)

2001 - 2002
Ph.D student
Brandenburg University of Technology Cottbus (Germany)

2002 - 2005
Postdoc
Brandenburg University of Technology Cottbus (Germany)

20052008
Postdoc
Justus Liebig University, Giessen (Germany)

2008 - 2015
Scientist
Taras Shevchenko National University of Kiev, Kyiv (Ukraine)

2015 - Present
Assistant professor
Taras Shevchenko National University of Kiev, Kyiv (Ukraine)

Solid State Nano-electronics

Research Fields:
Physics

Previous and Current Research

  • Perspective Materials for Aggressively Scaled Gate Stacks and Contact Structures of MOS devices;
  • Scanning probe microscopy investigations of silicon carbide and organic semiconductor surfaces;
  • Film growth, 2D layers and nanostructures on silicon and germanium substrates
  • Nanostructured 2D layers and adsorbate systems on metallic substrates;
  • Thin film based sensors of diverse environmental factors.

Future Projects and Goals

  • Self-assembled nanostructures on solid surfaces
  • Applied and fundamental aspects of plasma processing for integrated electronics manufacturing
  • Room temperature infra-red photo-sensors
  • Novel 2D materials and cost-effective methods of their mass production
  • Gas-sensors for chemical and bio-hazards remote detection

Methodological and Technical Expertise

  • Ultra-high vacuum scanning tunneling microscopy
  • Atomic force microscopy in ambient environment
  • Electron spectroscopy (Auger, photo-electron, electron energy loss)
  • Physical vapor deposition (PVD), chemical vapor deposition (CVD)
  • Preparation and characterization of atomically clean and atomically flat surfaces

Selected Publications

Goriachko, A., Melnik, P.V., Nakhodkin, M.G.
A suggestion of the graphene/Ge(111) structure based on ultra-high vacuum scanning tunneling microscopy investigation
Ukrainian Journal of Physics, 61 (2016) 75-87.

Kutana, A., Goriachko, A., Hu, Z., Sachdev, H., Over, H., Yakobson, B.I.
Buckling Patterns of Graphene-Boron Nitride Alloy on Ru(0001)
Advanced Materials Interfaces, 2 (2015) art. no. 1500322.

Goriachko, A., Kulyk, S.P., Melnik, P.V., Nakhodkin, M.G.
Scanning tunneling microscopy investigation of the Si(001)-c(8 × 8) nanostructured surface
Ukrainian Journal of Physics, 60 (2015) 148-152.

Goriachko, A., Melnik, P.V., Nakhodkin, M.G.
New features of the Ge(111) surface with co-existing c(2 × 8) and 2 × 2 reconstructions investigated by scanning tunneling microscopy
Ukrainian Journal of Physics, 60 (2015) 1132-1142.

Goriachko, A., Shchyrba, A., Melnik, P.V., Nakhodkin, M.G.
Bismuth growth on Ge(111): Evolution of morphological changes from nanocrystals to films
Ukrainian Journal of Physics, 59 (2014) 805-818.

Romanyuk, B., Melnik, V., Popov, V., Babich, V., Kladko, V., Gudymenko, O., Ilchenko, V., Vasyliev, I., Goriachko, A.
Structural and electrical properties of oxygen complexes in Cz and FZ silicon crystals implanted with carbon ions
Nanoscale Research Letters, 9 (2014) art. no. A001.

Goriachko, A., Melnik, P.V., Nakhodkin, M.G., Zakharov, A.A., Over, H.
Hexagonal C and BN superstructures on Ru(0001) and Ge(111)
Materialwissenschaft und Werkstofftechnik, 44 (2013) 129-135.

Goriachko, A., Melnik, P.V., Shchyrba, A., Kulyk, S.P., Nakhodkin, M.G.
Initial stages of Bi/Ge(111) interface formation: A detailed STM study
Surface Science, 605 (2011) 1771-1777.

Goriachko, A., Over, H.
Modern nanotemplates based on graphene and single layer h-BN
Zeitschrift fur Physikalische Chemie, 223 (2009) 157-168.

Dudin, P., Barinov, A., Dalmiglio, M., Gregoratti, L., Kiskinova, M., Goriachko, A., Over, H.
Nanoscale morphology and oxidation of ion-sputtered Rh(1 1 0) and Ru(0 0 0 1)
Journal of Electron Spectroscopy and Related Phenomena, 166-167 (2008) 89-93.

Goriachko, A., Zakharov, A.A., Over, H.
Oxygen-etching of h-BN/Ru(0001) nanomesh on the nano- and mesoscopic scale
Journal of Physical Chemistry C, 112 (2008) 10423-10427.

Goriachko, A., He, Y.B., Over, H.
Complex growth of NanoAu on BN nanomeshes supported by Ru(0001)
Journal of Physical Chemistry C, 112 (2008) 8147-8152.

He, Y.B., Goriachko, A., Korte, C., Farkas, A., Mellau, G., Dudin, P., Gregoratti, L., Barinov, A., Kiskinova, M., Stierle, A., Kasper, N., Bajt, S., Over, H.
Oxidation and reduction of ultrathin nanocrystalline Ru films on silicon: Model system for Ru-capped extreme ultraviolet lithography optics
Journal of Physical Chemistry C, 111 (2007) 10988-10992.

Berner, S., Corso, M., Widmer, R., Groening, O., Laskowski, R., Blaha, P., Schwarz, K., Goriachko, A., Over, H., Gsell, S., Schreck, M., Sachdev, H., Greber, T., Osterwalder, J.
Boron nitride nanomesh: Functionality from a corrugated monolayer
Angewandte Chemie - International Edition, 46 (2007) 5115-5119.

Goriachko, A., He, Y., Knapp, M., Over, H., Corso, M., Brugger, T., Berner, S., Osterwalder, J., Greber, T.
Self-assembly of a hexagonal boron nitride nanomesh on Ru(0001)
Langmuir, 23 (2007) 2928-2931.

Bulavenko, S.Y., Melnik, P.V., Nakhodkin, M.G., Goriachko, A.
Investigation of hydrogen interaction with the Si(1 1 1)-7 × 7 surface by STM with Bi/W tips
Surface Science, 600 (2006) 1185-1192.

Müller, K., Burkov, Y., Mandal, D., Henkel, K., Paloumpa, I., Goryachko, A., Schmeißer, D.
Microscopic and Spectroscopic Characterisation of Interfaces and Dielectric Layers for OFET Devices
Organic Electronics: Structural and Electronic Properties of OFETs, (2009) pp. 445-468.

Müller, K., Burkov, Y., Mandal, D., Henkel, K., Paloumpa, I., Goryachko, A., Schmeißer, D.
Microscopic and spectroscopic characterization of interfaces and dielectric layers for OFET devices
Physica Status Solidi (A) Applications and Materials Science, 205 (2008) 600-611.

Hoffmann, P., Goryachko, A., Schmeißer, D.
Oxynitrides on 4H-SiC(0 0 0 1)
Materials Science and Engineering B: Solid-State Materials for Advanced Technology, 118 (2005) 270-274.

Fursenko, O., Bauer, J., Zaumseil, P., Krüger, D., Goryachko, A., Yamamoto, Y., Köpke, K., Tillack, B.
Spectroscopic ellipsometry for in-line process control of SiGe:C HBT technology
Materials Science in Semiconductor Processing, 8 (2005) 273-278.

Müller, K., Goryachko, A., Burkov, Y., Schwiertz, C., Ratzke, M., Köble, J., Reif, J., Schmeißer, D.
Scanning Kelvin probe and photoemission electron microscopy of organic source-drain structures
Synthetic Metals, 146 (2004) 377-382.

Goryachko, A., Paloumpa, I., Beuckert, G., Burkov, Y., Schmeißer, D.
The interaction of Pr2O3 with 4H-SiC(0001) surface
Physica Status Solidi C: Conferences, 1 (2004) 265-268.

Krüger, D., Penkov, A., Yamamoto, Y., Goryachko, A., Tillack, B.
Characterization of Ge gradients in SiGe HBTs by AES depth profile simulation
Applied Surface Science, 224 (2004) 51-54.

Fursenko, O., Bauer, J., Goryachko, A., Bolze, D., Zaumseil, P., Krüger, D., Wolansky, D., Bugiel, E., Tillack, B.
Development of spectroscopic ellipsometry as in-line control for Co SALICIDE process
Thin Solid Films, 450 (2004) 248-254.

Goryachko, A., Yeromenko, Y., Henkel, K., Wollweber, J., Schmeißer, D.
The Si(001)/C2H2 interaction to form a buffer layer for 3C-SiC growth
Physica Status Solidi (A) Applied Research, 201 (2004) 245-248.

Melnik, V., Wolanski, D., Bugiel, E., Goryachko, A., Chernjavski, S., Krüger, D.
Influence of N2H2 plasma treatment on chemical vapor deposited TiN multilayer structures for advanced CMOS technologies
Materials Science and Engineering B: Solid-State Materials for Advanced Technology, 102 (2003) 358-361.

Goryachko, A., Liu, J.P., Krüger, D., Osten, H.J., Bugiel, E., Kurps, R., Melnik, V.
Thermal stability of Pr2O3 films grown on Si(100) substrate
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 20 (2002) 1860-1866.

Goryachko, A., Melnik, P.V, Nakhodkin, N.G, Afanasjeva, T.V, Koval, I.F
New features of the Si(1 0 0)-c(4 × 4) reconstruction observed with STM: Suggestion of the structure with lowered symmetry
Surface Science, 497 (2002) 47-58.

Goryachko, A., Krüger, D., Kurps, R., Weidner, G., Pomplun, K.
Improved Auger electron spectroscopy sputter depth profiling of W/WNx and WSix layers on Si substrates
Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films, 19 (2001) 2174-2180.

Contacts


andreandy2000@gmail.com